CENTRE FOR NANOSTRUCTURE IMAGING

Hitachi S-5200 

 

High resolution 'in lens' scanning electron microscope.

 

Resolution:

 0.4nm at 30kV

1.8nm at 1kV

 

SE/BSE detectors

STEM detector

 

Oxford Inca EDX

 

FEI ESEM   Hitachi S-5200   JEOL 2010   LEO 912B    Hitachi H-7000     Hitachi TM-1000